IEEE Unapproved Draft Std P1671.5/D6, July 2008 IEEE Draft Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information Via XML, Exchanging Test Adapter Information
Institute of Electrical and Electronics Engineers (IEEE)
Scope
This document specifies an exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station. This test station may be used as a component of a test program set (TPS) to test and diagnose a unit under test (UUT).