EIA-970-2013
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors

Standard No.

EIA-970-2013

Release Date

2013

Published By

ECIA - Electronic Components Industry Association

Scope

This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.