KS C IEC 62047-8-2015(2020)
Semiconductor devices ― Micro-electromechanical devices ― Part 8: Strip bending test method for tensile property measurement of thin films

Standard No.

KS C IEC 62047-8-2015(2020)

Release Date

2015

Published By

Korean Agency for Technology and Standards (KATS)

Latest

KS C IEC 62047-8-2015(2020)

KS C IEC 62047-8-2015(2020) history

• 0000 KS C IEC 62047-8-2015(2020)
• 2015 KS C IEC 62047-8:2015 Semiconductor devices ― Micro-electromechanical devices ― Part 8: Strip bending test method for tensile property measurement of thin films