IEEE Approved Draft Std P1671.3/D8, Aug 2007
IEEE Draft Trial-Use Standard for Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information Via XML (Xtensible Markup Language): Exchanging UUT (Unit-Under-Test) Description Information

Standard No.

IEEE Approved Draft Std P1671.3/D8, Aug 2007

Release Date

2023

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Scope

This document specifies an exchange format, utilizing XML, for identifying all of the hardware, software and documentation associated with a unit under test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS).