IEEE Unapproved Draft Std P1505.1_D8, Jan 2008
IEEE Draft Trial-Use Standard for Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Standard 1505

Standard No.

IEEE Unapproved Draft Std P1505.1_D8, Jan 2008

Release Date

2023

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Scope

This document, the IEEE 1505.1 Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Standard 1505 represents an extension to the IEEE-1505 Receiver Fixture Interface (RFI) Standard Specifications. Particular emphasis is placed on defining within the IEEE-1505 RFI Standard a more specific set of performance requirements that employ a...