UNE-EN IEC 60749-5:2024 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in March of 2024.)
This standard specifies the mechanical and climatic test methods for semiconductor devices. It focuses on part five of the series, which addresses steady-state temperature and humidity bias life testing. The document outlines procedures to evaluate the durability and reliability of semiconductor components under prolonged exposure to varying environmental conditions. These tests are crucial for ensuring that semiconductor products meet quality and performance requirements in different application scenarios.
*** Please note: This description may not be accurate, please refer to the official documentation.
UNE-EN IEC 60749-5:2024 history
2024UNE-EN IEC 60749-5:2024 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in March of 2024.)