BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods - Storage at high temperature
- Standard No.
- BS EN 60749-6:2017
- Release Date
- 2017
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN 60749-6:2017
- Scope
- What is BS EN IEC 60749-6 - Storage at high temperatures of semiconductor devices about? BS EN IEC 60749 is an international standard covering storage at high temperatures of semiconductor devices, facilitating the operability and performance in electronic applications. The purpose of BS EN 60749-6 is to test and determine the effect on all-solid-state electronic devices of storage at elevated temperatures without electrical stress applied. BS EN 60749-6 test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure methods and time-to-failure of s...
BS EN 60749-6:2017 history
- 2018 BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
- 2002 BS EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency
- 1999 BS EN 60749:1999 Semiconductor devices - Mechanical and climatic test methods
- 0000 BS 6493-3:1986
