KS D 0257-2002(2022)
Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method

Standard No.

KS D 0257-2002(2022)

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Latest

KS D 0257-2002(2022)

KS D 0257-2002(2022) history

• 0000 KS D 0257-2002(2022)
• 0000 KS D 0257-2002(2017)
• 2002 KS D 0257-2002 Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
• 0000 KS D 0257-1999