IEEE P1500/D1.3, May 2021
IEEE Draft Standard Testability Method for Embedded Core-based Integrated Circuits

Standard No.
IEEE P1500/D1.3, May 2021
Release Date
2021
Published By
Institute of Electrical and Electronics Engineers (IEEE)
Scope
A mechanism for the test of core designs within a system on chip (SoC) is defined. This mechanism is a hardware architecture and the core test language (CTL) is leveraged to facilitate communication between core designers and core integrators.



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