IEC 62528:2007 (E)
IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits

Standard No.
IEC 62528:2007 (E)
Release Date
2007
Published By
Institute of Electrical and Electronics Engineers (IEEE)
Scope
This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.



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