Institute of Electrical and Electronics Engineers (IEEE)
Scope
IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory Integrated Circuits (ICs) where additional pins for testing are not available and implementing Boundary-Scan (IEEE 1149.1) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behaviora...