20/30405217 DC
BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices. Part 40. Test methods of Micro-electromechanical inertial shock switch threshold

Standard No.

20/30405217 DC

Release Date

2020

Published By

British Standards Institution (BSI)

Latest

20/30405217 DC

20/30405217 DC history

• 0000 20/30405217 DC