IEEE Std 1671.5-2008 (Full_Use)
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

Standard No.

IEEE Std 1671.5-2008 (Full_Use)

Release Date

2012

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Scope

An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test.