KS C IEC 60747-4-1-2002(2017)
Semiconductor devices－Discrete devices－Part 4－1：Microwave diodes and transistors－Microwave field effect transistors－Blank detail specification

Standard No.

KS C IEC 60747-4-1-2002(2017)

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Status

Withdraw

Latest

KS C IEC 60747-4-1-2002(2017)

KS C IEC 60747-4-1-2002(2017) history

• 0000 KS C IEC 60747-4-1-2002(2017)
• 2002 KS C IEC 60747-4-1:2002 Semiconductor devices－Discrete devices－Part 4－1：Microwave diodes and transistors－Microwave field effect transistors－Blank detail specification