KS A ISO 8769-2-2003(2023) Baseline source for surface contamination monitor calibration - Part 2: Electron energy below 0.15 MeV and photon energy below 1.5 MeV
2003KS A ISO 8769-2:2003 Reference sources for the calibration of surface contamination monitors-Part 2:Electrons of energy less than 0.15 MeV and photons of energy less than 1.5 MeV