IEEE Unapproved Draft Std P1671.6/D6, July 2008
IEEE Draft Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information Via XML, Exchanging Test Station Information

Standard No.

IEEE Unapproved Draft Std P1671.6/D6, July 2008

Release Date

2023

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Scope

This document specifies an exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station. This test station may be used as a component of a test program set (TPS) to test and diagnose a unit under test (UUT).